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We have more Special DataSheet than other site. If, There is not a datasheet which searches, Request ! (It will updated in 12 hours.)
GetDatasheet is a free electronic engineering tool that enables you to locate product datasheets from hundreds of electronic component manufacturers worldwide.

Found: 247      Displaying: 61 - 80
#
Part:
Description:
Manuf.
Package
Pins
T°min
T°max
PDF size
61.
LB1837MLow-voltage/low-saturation bidirectional constant-voltage regulated motor driver
SANYO
MFP14S
14
-20°C
80°C
86K
62.
LC7232-8377Single-chip PLL and microcontroller with LCD driver
SANYO
QIP80A
80
-40°C
85°C
852K
63.
MMBD2837LT1Monolithic Dual Switching Diode
ON
SOT-23
3
-
-
82K
64.
SCAN18373TSSC Transparent Latch with 3-STATE Outputs
FAIR
SSOP
56
-
-
99K
65.
SCAN18373TSSCX Transparent Latch with 3-STATE Outputs
FAIR
SSOP
56
-
-
99K
66.
SCAN18374TSSC D Flip-Flop with 3-STATE Outputs
FAIR
SSOP
56
-
-
99K
67.
SN74BCT8373ADW IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
TI
DW
24
0°C
70°C
294K
68.
SN74BCT8373ADWR IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
TI
DW
24
0°C
70°C
294K
69.
SN74BCT8373ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
TI
NT
24
0°C
70°C
294K
70.
SN74BCT8374ADW SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
71.
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
72.
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
73.
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
NT
24
0°C
70°C
294K
74.
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
NT
24
0°C
70°C
294K
75.
SN74SSTL16837ADGGR 20-BIT SSTL_3 INTERFACE UNIVERSAL BUS DRIVER WITH 3-STATE OUTPUTS
TI
DGG
64
0°C
70°C
93K
76.
SN74SSTL16837ADGGR 20-BIT SSTL_3 INTERFACE UNIVERSAL BUS DRIVER WITH 3-STATE OUTPUTS
TI
DGG
64
0°C
70°C
93K
77.
SNJ54BCT8373AFK SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
TI
FK
28
-55°C
125°C
294K
78.
SNJ54BCT8373AJT SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
TI
JT
24
-55°C
125°C
294K
79.
SNJ54BCT8374AJT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
JT
24
-55°C
125°C
294K
80.
UPD16837GSActuator driver for optical disk 30-pin SSOP
NEC
30-P-SSOP
-
-
-
110K
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