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SNJ54BCT8373AFK Datasheet

 Datasheet for Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
Manufacturer:Texas Instruments
Temp. range:Min: -55°C | Max: 125°C
Package:FK
Pins:28
Datasheet:SNJ54BCT8373AFK.PDF (294Kb)


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#
Component part name
Component Description
Manufacturer
PDF size
1.
SNJ54BCT8373AFK SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
TI
294K
2.
SNJ54BCT8373AJT SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
TI
294K
3.
SNJ54BCT8374AFK SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
294K
4.
SNJ54BCT8374AFK SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
294K
5.
SNJ54BCT8374AJT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
294K

SNJ54BCT8373AFK.PDF


SNJ54BCT8373AFK Datasheet

SNJ54BCT8373AFK Datasheet

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

SNJ54BCT8373AFK Datasheet

 
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