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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 1. | 5962R9865203QYA | Low voltage quad receiver: SMD. QML class Q. Lead finish hot solder dipped. Total dose 1E5 rad(Si). | UTMC | FlatPack | 16 | -55°C | 125°C | 77K |
| 2. | 5962R9865203VYA | Low voltage quad receiver: SMD. QML class V. Lead finish hot solder dipped. Total dose 1E5 rad(Si). | UTMC | FlatPack | 16 | -55°C | 125°C | 77K |
| 3. | SCN68652AC2A44 | Multi-protocol communications controller (MPCC). | PHLPS | SOT187-2 | 44 | 0°C | 70°C | 651K |
| 4. | SCN68652AC2A44 | Multi-protocol communications controller (MPCC). | PHLPS | SOT187-2 | 44 | 0°C | 70°C | 651K |
| 5. | SCN68652AC2A44 | Multi-protocol communications controller (MPCC). | PHLPS | PLCC | 44 | 0°C | 70°C | 651K |
| 6. | SCN68652AC2F40 | Multi-protocol communications controller (MPCC). | PHLPS | 0590B | 40 | 0°C | 70°C | 651K |
| 7. | SCN68652AC2F40 | Multi-protocol communications controller (MPCC). | PHLPS | Cerdip | 40 | 0°C | 70°C | 651K |
| 8. | SCN68652AC2F40 | Multi-protocol communications controller (MPCC). | PHLPS | Cerdip | 40 | 0°C | 70°C | 651K |
| 9. | SCN68652AC2N40 | Multi-protocol communications controller (MPCC). | PHLPS | SOT129-1 | 40 | 0°C | 70°C | 651K |
| 10. | SCN68652AC2N40 | Multi-protocol communications controller (MPCC). | PHLPS | DIP | 40 | 0°C | 70°C | 651K |
| 11. | SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 169K |
| 12. | SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 169K |
| 13. | SN74ABT8652DL | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DL | 28 | -40°C | 85°C | 366K |
| 14. | SN74ABT8652DLR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DL | 28 | -40°C | 85°C | 366K |
| 15. | SN74ABT8652DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DW | 28 | -40°C | 85°C | 366K |
| 16. | SN74ABT8652DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DW | 28 | -40°C | 85°C | 366K |
| 17. | SN74ABTH18652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 575K |
| 18. | SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 561K |
| 19. | SNJ54ABT8652FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | FK | 28 | -55°C | 125°C | 366K |
| 20. | SNJ54ABT8652JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | JT | 28 | -55°C | 125°C | 366K |
