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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 101. | DAC8248AW | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | CERDIP | 24 | -55°C | 125°C | 344K |
| 102. | DAC8248EW | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | CERDIP | 24 | -40°C | 85°C | 344K |
| 103. | DAC8248FP | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | DIP | 24 | -40°C | 85°C | 344K |
| 104. | DAC8248FW | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | CERDIP | 24 | -40°C | 85°C | 344K |
| 105. | DAC8248GP | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | DIP | 24 | 0°C | 70°C | 344K |
| 106. | DAC8248HP | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | DIP | 24 | 0°C | 70°C | 344K |
| 107. | DAC8248HS | 0-17V; dual 12-bit double-buffered CMOS D/A converter. For multichannel microprocessor-controlled systems | AD | SOL | 24 | 0°C | 70°C | 344K |
| 108. | DAC8408AT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | CERDIP | 28 | -55°C | 125°C | 215K |
| 109. | DAC8408BT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | CERDIP | 28 | -55°C | 125°C | 215K |
| 110. | DAC8408BT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | CERDIP | 28 | -55°C | 125°C | 215K |
| 111. | DAC8408ET | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | CERDIP | 28 | -40°C | 85°C | 215K |
| 112. | DAC8408FP | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | DIP | 28 | -40°C | 85°C | 215K |
| 113. | DAC8408FPC | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | PLCC | 28 | -40°C | 85°C | 215K |
| 114. | DAC8408FS | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | SOL | 28 | -40°C | 85°C | 215K |
| 115. | DAC8408FT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | CERDIP | 28 | -40°C | 85°C | 215K |
| 116. | DAC8408GP | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | AD | DIP | 28 | 0°C | 70°C | 215K |
| 117. | DAC8412BTC/883 | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | AD | LCC | 28 | -40°C | 85°C | 450K |
| 118. | DAC8412EP | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | AD | DIP | 28 | -40°C | 85°C | 450K |
| 119. | DAC8412FP | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | AD | DIP | 28 | -40°C | 85°C | 450K |
| 120. | DAC8412FPC | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | AD | PLCC | 28 | -40°C | 85°C | 450K |
