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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 1921. | SN74LS283D | 4-Bit Binary Full Adder with Fast Carry | ON | SOIC | 16 | - | - | 126K |
| 1922. | SN74LS283DR2 | 4-Bit Binary Full Adder with Fast Carry | ON | - | - | - | - | 126K |
| 1923. | SN74LS283MEL | 4-Bit Binary Full Adder with Fast Carry | ON | - | - | - | - | 126K |
| 1924. | SN74LS283ML1 | 4-Bit Binary Full Adder with Fast Carry | ON | - | - | - | - | 126K |
| 1925. | SN74LS283ML2 | 4-Bit Binary Full Adder with Fast Carry | ON | - | - | - | - | 126K |
| 1926. | SN74LS283N | 4-Bit Binary Full Adder with Fast Carry | ON | PDIP | 16 | - | - | 126K |
| 1927. | SN74LS682DW | 8-Bit Magnitude Comparitors | ON | SOIC | 20 | - | - | 148K |
| 1928. | SN74LS682DWR2 | 8-Bit Magnitude Comparitors | ON | SOIC | 20 | - | - | 148K |
| 1929. | SN74LS682H | 8-Bit Magnitude Comparitors | ON | PDIP | - | - | - | 148K |
| 1930. | SN74LS682N | 8-Bit Magnitude Comparitors | ON | PDIP | 20 | - | - | 148K |
| 1931. | SN74LS684MEL | 8-Bit Magnitude Comparitors | ON | - | - | - | - | 148K |
| 1932. | SN74LVTH182652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 561K |
| 1933. | SN74LVTH18502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 1934. | SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 1935. | SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 1936. | SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 1937. | SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 518K |
| 1938. | SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 548K |
| 1939. | SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 1940. | SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 561K |
