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Found: 1133      Displaying: 181 - 200
#
Part:
Description:
Manuf.
Package
Pins
T°min
T°max
PDF size
181.
74ACT8244RELAY DRIVER IC
STM
-
-
-
-
54K
182.
74ACT86QUAD EXCLUIVE OR GATE
STM
-
-
-
-
67K
183.
74VHCT86AQUAD EXCLUSIVE OR GATE
STM
-
-
-
-
55K
184.
HD74ACT86Quad. 2-input Exclusive-OR Gates
HIT
DP-14
-
-
-
43K
185.
MC74ACT86DQuad 2 Input Exclusive OR Gate
ON
SOIC
14
-
-
131K
186.
MC74ACT86DR2Quad 2 Input Exclusive OR Gate
ON
SOIC
14
-
-
131K
187.
MC74ACT86DTQuad 2 Input Exclusive OR Gate
ON
-
-
-
-
131K
188.
MC74ACT86DTELQuad 2 Input Exclusive OR Gate
ON
-
-
-
-
131K
189.
MC74ACT86DTR2Quad 2 Input Exclusive OR Gate
ON
-
-
-
-
131K
190.
MC74ACT86MQuad 2 Input Exclusive OR Gate
ON
-
14
-
-
131K
191.
MC74ACT86MELQuad 2 Input Exclusive OR Gate
ON
-
14
-
-
131K
192.
MC74ACT86ML2Quad 2 Input Exclusive OR Gate
ON
-
14
-
-
131K
193.
MC74ACT86MR1Quad 2 Input Exclusive OR Gate
ON
-
14
-
-
131K
194.
MC74ACT86MR2Quad 2 Input Exclusive OR Gate
ON
-
14
-
-
131K
195.
MC74ACT86NQuad 2 Input Exclusive OR Gate
ON
PDIP
14
-
-
131K
196.
SN74BCT8374ADW SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
197.
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
198.
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
DW
24
0°C
70°C
294K
199.
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
NT
24
0°C
70°C
294K
200.
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
TI
NT
24
0°C
70°C
294K
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