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We have more Special DataSheet than other site. If, There is not a datasheet which searches, Request ! (It will updated in 12 hours.)
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We have more Special DataSheet than other site. If, There is not a datasheet which searches, Request ! (It will updated in 12 hours.)
GetDatasheet is a free electronic engineering tool that enables you to locate product datasheets from hundreds of electronic component manufacturers worldwide.
Found: 196 Displaying: 161 - 180| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size | | 161. | AD7834AN | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | DIP | 28 | -40°C | 85°C | 361K | | 162. | AD7834AR | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | SOIC | 28 | -40°C | 85°C | 361K | | 163. | AD7834BN | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | DIP | 28 | -40°C | 85°C | 361K | | 164. | AD7834BR | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | SOIC | 28 | -40°C | 85°C | 361K | | 165. | AD7834SQ | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | CERDIP | 28 | -55°C | 125°C | 361K | | 166. | AD7835AP | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | PLCC | 44 | -40°C | 85°C | 361K | | 167. | AD7835AS | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | PQFP | 44 | -40°C | 85°C | 361K | | 168. | AD7835BS | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | AD | PQFP | 44 | -40°C | 85°C | 361K | | 169. | AD7836AS | 0.3-7V; 480mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumnetation | AD | MQFP | 44 | -40°C | 85°C | 183K | | 170. | AD7837AN | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | DIP | 24 | -40°C | 85°C | 198K | | 171. | AD7837AQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | CERDIP | 24 | -40°C | 85°C | 198K | | 172. | AD7837AR | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | SOIC | 24 | -40°C | 85°C | 198K | | 173. | AD7837BN | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | DIP | 24 | -40°C | 85°C | 198K | | 174. | AD7837BQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | CERDIP | 24 | -40°C | 85°C | 198K | | 175. | AD7837BR | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | SOIC | 24 | -40°C | 85°C | 198K | | 176. | AD7837SQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | AD | CERDIP | 24 | -40°C | 85°C | 198K | | 177. | AD7839AS | 0.3-7V; octal 13-bit, parallel input voltage-output DAC. For automatic test equipment, process control, general purpose instrumentation | AD | MQFP | 44 | -40°C | 85°C | 165K | | 178. | AD783AQ | 0.5-6.5V; complete very high speed sample-and-hold amplifier | AD | CERDIP | 8 | -40°C | 85°C | 103K | | 179. | AD783AR | 0.5-6.5V; complete very high speed sample-and-hold amplifier | AD | SOIC | 8 | -40°C | 85°C | 103K | | 180. | AD783JR | 0.5-6.5V; complete very high speed sample-and-hold amplifier | AD | SOIC | 8 | 0°C | 70°C | 103K |
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