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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 221. | 74LVTH125M | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | SOIC | 14 | - | - | 56K |
| 222. | 74LVTH125MTC | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | TSSOP | 14 | - | - | 56K |
| 223. | 74LVTH125MTCX | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | TSSOP | 14 | - | - | 56K |
| 224. | 74LVTH125MX | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | SOIC | 14 | - | - | 56K |
| 225. | 74LVTH125SJ | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | SOIC | 14 | - | - | 56K |
| 226. | 74LVTH125SJX | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | SOIC | 14 | - | - | 56K |
| 227. | 74LVTH125SJX | Low Voltage Quad Buffer with 3-STATE Outputs | FAIR | SOIC | 14 | - | - | 56K |
| 228. | 74LVTH162240MEA | Low Voltage 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs and 25 Ohm Series Resistors in the Outputs | FAIR | SSOP | 48 | - | - | 53K |
| 229. | 74LVTH162240MEX | Low Voltage 16-Bit Inverting Buffer/Line Driver with 3-STATE Outputs and 25 Ohm Series Resistors in the Outputs | FAIR | SSOP | 48 | - | - | 53K |
| 230. | SN74LVTH182512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 518K |
| 231. | SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 232. | SN74LVTH182652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 561K |
| 233. | SN74LVTH18502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 234. | SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 235. | SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 236. | SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 237. | SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 518K |
| 238. | SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 548K |
| 239. | SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 240. | SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 561K |
