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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 21. | GTLP6C816APMTC | LVTTL-to-GTLP Clock Driver | FAIR | TSSOP | 24 | - | - | 52K |
| 22. | GTLP6C816APMTCX | LVTTL-to-GTLP Clock Driver | FAIR | TSSOP | 24 | - | - | 52K |
| 23. | IDT49FCT806APY | Fast CMOS buffer/lock driver | IDT | SOIC | 20 | 0°C | 70°C | 126K |
| 24. | IDT49FCT806APYB | Fast CMOS buffer/lock driver | IDT | SOIC | 20 | -55°C | 125°C | 126K |
| 25. | IDT54FCT646APB | Fast CMOS octal transceiver/register | IDT | PDIP | - | -55°C | 125°C | 91K |
| 26. | IDT75FCT646APB | Fast CMOS octal transceiver/register | IDT | PDIP | - | 0°C | 70°C | 91K |
| 27. | KIA7806API | 6V, 1A three-terminal positive voltage regulator | KEC | TO-220IS | 3 | -30°C | 150°C | 382K |
| 28. | LNM116AP01 | Numeric display visible light emitting diode. Numeric Size (14.4mm, 0.6inch, 1-Element Type) | PANAS | - | - | - | - | 21K |
| 29. | LNM126AP01 | Numeric display visible light emitting diode. Numeric Size (14.4mm, 0.6inch, 2-Element Type) | PANAS | - | - | - | - | 21K |
| 30. | SN74ABTH182646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 31. | SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 32. | SN74LV4066APWR | QUADRUPLE BILATERAL ANALOG SWITCH | TI | PW | 14 | -40°C | 85°C | 178K |
| 33. | SN74LVC126APWLE | QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS | TI | PW | 14 | -40°C | 85°C | 121K |
| 34. | SN74LVC126APWLE | QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS | TI | PW | 14 | -40°C | 85°C | 121K |
| 35. | SN74LVC126APWR | QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS | TI | PW | 14 | -40°C | 85°C | 121K |
| 36. | SN74LVC126APWR | QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS | TI | PW | 14 | -40°C | 85°C | 121K |
| 37. | SN74LVC646APWLE | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | PW | 24 | -40°C | 85°C | 197K |
| 38. | SN74LVC646APWR | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | PW | 24 | -40°C | 85°C | 197K |
| 39. | SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 40. | SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
