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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 61. | CY7C43646AV-10AC | 3.3V SYNC X36 TRI BUS FIFO | CYPR | - | - | - | - | 574K |
| 62. | CY7C43646AV-15AC | 3.3V SYNC X36 TRI BUS FIFO | CYPR | - | - | - | - | 574K |
| 63. | CY7C43646AV-7AC | 3.3V SYNC X36 TRI BUS FIFO | CYPR | - | - | - | - | 574K |
| 64. | IDT54FCT646AE | Fast CMOS octal transceiver/register | IDT | CERPACK | - | -55°C | 125°C | 91K |
| 65. | IDT54FCT646AEB | Fast CMOS octal transceiver/register | IDT | CERPACK | - | -55°C | 125°C | 91K |
| 66. | IDT75FCT646AE | Fast CMOS octal transceiver/register | IDT | CERPACK | - | 0°C | 70°C | 91K |
| 67. | IDT75FCT646AE | Fast CMOS octal transceiver/register | IDT | CERPACK | - | 0°C | 70°C | 91K |
| 68. | IDT75FCT646AEB | Fast CMOS octal transceiver/register | IDT | CERPACK | - | 0°C | 70°C | 91K |
| 69. | SN74ABTH182646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 70. | SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 71. | SN74LVC646ADW | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DW | 24 | -40°C | 85°C | 197K |
| 72. | SN74LVC646ADWR | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DW | 24 | -40°C | 85°C | 197K |
| 73. | SN74LVC646APWLE | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | PW | 24 | -40°C | 85°C | 197K |
| 74. | SN74LVC646APWR | OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | PW | 24 | -40°C | 85°C | 197K |
| 75. | SN74LVCH16646ADGGR | 16-BIT BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DGG | 56 | -40°C | 85°C | 190K |
| 76. | SN74LVCH16646ADGVR | 16-BIT BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DGV | 56 | -40°C | 85°C | 190K |
| 77. | SN74LVCH16646ADL | 16-BIT BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DL | 56 | -40°C | 85°C | 190K |
| 78. | SN74LVCH16646ADLR | 16-BIT BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS | TI | DL | 56 | -40°C | 85°C | 190K |
| 79. | SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 80. | SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
