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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 81. | 2SC5049 | Small signal high frequency amplifier transistor | HIT | MPAK | - | - | - | 24K |
| 82. | MC14504BCP | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | PDIP | 16 | - | - | 188K |
| 83. | MC14504BD | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | SOIC | 16 | - | - | 188K |
| 84. | MC14504BDR2 | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | SOIC | 16 | - | - | 188K |
| 85. | MC14504BDT | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | TSSOP | 16 | - | - | 188K |
| 86. | MC14504BF | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | MFP | 16 | - | - | 188K |
| 87. | MC14504BF | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | MFP | 16 | - | - | 188K |
| 88. | MC14504BFEL | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | MFP | 16 | - | - | 188K |
| 89. | MC14504BFR2 | Hex Level Shifter for TTL to CMOS or CMOS to CMOS | ON | MFP | 16 | - | - | 188K |
| 90. | SN74ABT18504PM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 450K |
| 91. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 92. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 93. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 94. | SN74ABTH18504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 95. | SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 96. | SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 97. | SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 98. | SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 99. | TLV1504IPW | 10-BIT 200 KSPS ADC SERIAL OUT, HARDWARE/SOFTWARE/AUTO POWERDOWN, PGRMABLE AUTO CHANNEL SWEEP, 4 CH. | TI | PW | 16 | -40°C | 85°C | 638K |
| 100. | TLV1504IPWR | 10-BIT 200 KSPS ADC SERIAL OUT, HARDWARE/SOFTWARE/AUTO POWERDOWN, PGRMABLE AUTO CHANNEL SWEEP, 4 CH. | TI | PW | 16 | -40°C | 85°C | 638K |
