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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 81. | 2SK1859 | Power switching MOSFET | HIT | TO-3PFM | - | - | - | 33K |
| 82. | SN74ABT18502PM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVER | TI | PM | 64 | -40°C | 85°C | 451K |
| 83. | SN74ABT18504PM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 450K |
| 84. | SN74ABTH18502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 85. | SN74ABTH18502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 86. | SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 87. | SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 88. | SN74ABTH18504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 89. | SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 544K |
| 90. | SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 544K |
| 91. | SN74LVTH18502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 92. | SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 93. | SN74LVTH18504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 94. | SN74LVTH18504APMR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 95. | SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 518K |
| 96. | SN74LVTH18514DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | DGG | 64 | -40°C | 85°C | 548K |
| 97. | SNJ54ABT18502HV | SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER | TI | HV | 68 | -55°C | 125°C | 409K |
| 98. | SNJ54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | HV | 68 | -55°C | 125°C | 549K |
| 99. | SNJ54LVT18502HV | 3.3V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | HV | 68 | -55°C | 125°C | 405K |
| 100. | SNJ54LVTH18502AHV | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | HV | 68 | -55°C | 125°C | 478K |
