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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 1. | SN74ABTH182502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 2. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 3. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 4. | SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 5. | SN74ABTH182646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 6. | SN74ABTH182652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 575K |
| 7. | SN74ABTH182652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 575K |
| 8. | SN74ABTH18502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 9. | SN74ABTH18502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 10. | SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 11. | SN74ABTH18502APMR | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 549K |
| 12. | SN74ABTH18504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 547K |
| 13. | SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 14. | SN74ABTH18652APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 575K |
| 15. | SN74LVTH182502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 478K |
| 16. | SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 17. | SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | TI | PM | 64 | -40°C | 85°C | 544K |
| 18. | SNJ54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | HV | 68 | -55°C | 125°C | 549K |
| 19. | SNJ54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | HV | 68 | -55°C | 125°C | 559K |
| 20. | SNJ54LVTH18502AHV | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | TI | HV | 68 | -55°C | 125°C | 478K |
