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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 1. | 8646 | T-1 3/4 subminiature, miniature flanged lamp. 14.0 volts, 0.080 amps. | GTL | - | 2 | - | - | 33K |
| 2. | CXP86460 | CMOS 8-bit Single Chip Microcomputer | SONY | - | - | - | - | 354K |
| 3. | CXP86461 | CMOS 8-bit Single Chip Microcomputer | SONY | - | - | - | - | 240K |
| 4. | SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 145K |
| 5. | SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 145K |
| 6. | SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 145K |
| 7. | SN74ABT8646DL | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DL | 28 | -40°C | 85°C | 388K |
| 8. | SN74ABT8646DLR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DL | 28 | -40°C | 85°C | 388K |
| 9. | SN74ABT8646DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DW | 28 | -40°C | 85°C | 388K |
| 10. | SN74ABT8646DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | DW | 28 | -40°C | 85°C | 388K |
| 11. | SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 559K |
| 12. | SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | PM | 64 | -40°C | 85°C | 551K |
| 13. | SNJ54ABT18646HV | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | TI | HV | 68 | -55°C | 125°C | 414K |
| 14. | SNJ54ABT8646FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | FK | 28 | -55°C | 125°C | 388K |
| 15. | SNJ54ABT8646JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | TI | JT | 28 | -55°C | 125°C | 388K |
| 16. | SNJ54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | TI | HV | 68 | -55°C | 125°C | 559K |
