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# | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
121. | HD74BC240A | Octal Buffers/Line Drivers with 3-state outputs | HIT | DP-20N | - | - | - | 39K |
122. | HD74LV240A | Octal Buffers/Line Drivers/Line Receivers with inverted 3-state outputs | HIT | SOP-20 | - | - | - | 68K |
123. | HD74LVC16240A | 16-bit Buffers/Line Drivers with 3-state inverted outputs | HIT | TSSOP-48 | - | - | - | 51K |
124. | HD74LVCZ16240A | 16-bit Buffers/Line Drivers/Line Receivers with inverted 3-state outputs (live insertion) | HIT | TSSOP-48 | - | - | - | 54K |
125. | HD74LVCZ240A | Octal Buffers/Line Drivers/Line Receivers with inverted 3-state outputs (live insertion) | HIT | SOP-20 | - | - | - | 57K |
126. | MC74HC240ADT | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | TSSOP | 20 | - | - | 180K |
127. | MC74HC240ADTEL | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | TSSOP | 20 | - | - | 180K |
128. | MC74HC240ADTR2 | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | TSSOP | 20 | - | - | 180K |
129. | MC74HC240ADW | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | SOIC | 20 | - | - | 180K |
130. | MC74HC240ADWR2 | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | SOIC | 20 | - | - | 180K |
131. | MC74HC240AF | Octal With 3-State Outputs Inverting Buffer/Line Driver/Line Receiver | ON | TSSOP | 20 | - | - | 180K |
132. | SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | TI | DW | 24 | 0°C | 70°C | 293K |
133. | SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | TI | DW | 24 | 0°C | 70°C | 293K |
134. | SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | TI | NT | 24 | 0°C | 70°C | 293K |
135. | SN74LVT240APWR | 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS | TI | PW | 20 | -40°C | 85°C | 110K |
136. | SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | TI | FK | 28 | -55°C | 125°C | 293K |
137. | SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | TI | FK | 28 | -55°C | 125°C | 293K |
138. | SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | TI | FK | 28 | -55°C | 125°C | 293K |
139. | SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | TI | FK | 28 | -55°C | 125°C | 293K |
140. | SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | TI | JT | 24 | -55°C | 125°C | 293K |