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|Description:|| IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES|
|Temp. range:||Min: 0°C | Max: 70°C|
Related datasheets for SN74BCT8373ANT:Lower in the list you can see the relative results of searching, which resembling the inquiring. If there is no necessary name in the results of searching for SN74BCT8373ANT – look at the relative results.
|#||Component part name||Component Description||Manufacturer||PDF size|
|1.||SN74BCT8373ADW|| IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES||TI||294K|
|2.||SN74BCT8373ADWR|| IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES||TI||294K|
|3.||SN74BCT8373ANT|| IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES||TI||294K|
|4.||SN74BCT8374ADW|| SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS||TI||294K|
|5.||SN74BCT8374ADWR|| SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS||TI||294K|
|6.||SN74BCT8374ADWR|| SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS||TI||294K|
SN74BCT8373ANT Datasheet SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS